Note:
1. Test frequency : 100KHz /1.0Vdc
2. All test data referenced to 20℃ ambient.
3. Testing Instrument : L: HP4284A,CH11025,CH3302,CH1320 ,CH1320S LCR METER / Rdc:CH16502,Agilent33420A MICRO OHMMETER.
4. Heat Rated Current (Irms) will cause the coil temperature rise approximately T=40 without core loss. △ ℃
5. Saturation Current (Isat) will cause L0 to drop approximately 20% typical..
6. The part temperature (ambient + temp rise) should not exceed 125 under worst case operating conditions ℃ .Circuit design,component,PCB trace size and
thickness,airflow and other cooling provisions all affect the part temperature. Part temperature should be verified in the end application.